Aufgrund von Wartungsarbeiten ist die Suche von Publikationen nach Autor:innen derzeit nicht möglich.
Hamraz Javaheri; FREDERIK LAUER; LUISA LAUER; KRISTIN ALTMEYER; ROLAND BRÜNKEN; MARKUS PESCHEL; NORBERT WEHN; Paul Lukowicz
In: UbiComp/ISWC. International Conference on Ubiquitous Computing (Ubicomp-2022), September 11-15, ACM Digital Library, 2022.
Hamraz Javaheri; JESSICA LEHMANN; KRISTIN ALTMEYER; LEA MARIE MÜLLER; ROLAND BRÜNKEN; Paul Lukowicz
Hamraz Javaheri; Sencer Melih Deniz; Juan Felipe Vargas; Dogan Urgun; Fariza Sabit; Mahmut Tok; Mehmet Haklidir; Bo Zhou; Paul Lukowicz
In: IEEÉ-BHI-BSN 2022. IEEE-EMBS International Conference on Biomedical and Health Informatics (BHI-22), IEEE-EMBS INTERNATIONAL CONFERENCE ON …
Clara Elisabeth Gleiß; Emil Woop; Esther Zahn
In: MYOW - Make Your Own Wearable. Toolkits & Wearables: Developing Toolkits for Exploring Wearable Designs, located at CHI 2022, April 30, New …
Shubham Vyas; Lasse Maywald; Shivesh Kumar; Marko Jankovic; Andreas Mueller; Frank Kirchner
In: Advances in Space Research, Vol. 1, Pages 1-18, Elsevier Ltd. 2022.
Mina Ameli; Philipp Aaron Becker; Katharina Lankers; Markus van Ackeren; Holger Bähring; Wolfgang Maaß
In: International Conference on Machine Learning and Applications. International Conference on Machine Learning and Applications (ICMLA-2022), located …
Huy Phan; Thi Ngoc Tho Nguyen; Philipp Koch; Alfred Mertins
In: Proc. IEEE International Conference on Acoustics, Speech and Signal Processing. International Conference on Acoustics, Speech and Signal …
Marco Maass; Christine Droigk; Mathias Eulers; Alfred Mertins
In: International Journal on Magnetic Particle Imaging, Vol. 8, No. 1, Pages 1-4, Infinite Science Publishing, 2022.
Alexander Fabisch; Manuela Uliano; Dennis Marschner; Melvin Laux; Johannes Brust; Marco Controzzi
In: Proceedings of the IEEE-RAS International Conference on Humanoid Robots. IEEE-RAS International Conference on Humanoid Robots (Humanoids-2022), …
Huy Phan; Oliver Y. Chén; Minh C. Tran; Philipp Koch; Alfred Mertins; Maarten De Vos
In: IEEE Transactions on Pattern Analysis and Machine Intelligence (PAMI), Vol. 44, No. 9, Pages 5903-5915, IEEE, 2022.