Tobias Jungbluth; Maurice Rekrut; Antonio Krüger
In: Proceedings of the IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering. IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE-2023), Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, October 25-27, Mailand, Italy, IEEE, 2023.