Kognitive Assistenzsysteme

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1. Patrick Trampert; Delei Chen; Sviatoslav Bogachev; Tim Dahmen; Philipp Slusallek

   Dictionary-based Filling of the Missing Wedge in Electron Tomography

   In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages …

2. Tim Dahmen; Michael Engstler; Christoph Pauly; Patrick Trampert; Niels de Jonge; Frank Mücklich; Philipp Slusallek

   Feature Adaptive Sampling for Scanning Electron Microscopy

   In: Scientific Reports (Sci Rep), Vol. 6, Page 25350, Nature Publishing Group, 5/2016.

3. Tim Dahmen; Holger Kohr; Andrew Lupini; Jean-Pierre Beaudoin; Christian Kübel; Patrick Trampert; Philipp Slusallek; Niels de Jonge

   Combined Tilt- and Focal-Series Tomography for HAADF-STEM

   In: Microscopy Today, Vol. 24, Pages 26-30, Microscopy Today, 5/2016.

4. Patrick Trampert; Sviatoslav Bogachev; Nico Marniok; Tim Dahmen; Philipp Slusallek

   A Comparative Study of Three Marker Detection Algorithms in Electron Tomography

   In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Pages …

5. Tim Dahmen; Philipp Slusallek; Patrick Trampert; Frank Mücklich; Michael Engstler; Christoph Pauly; Niels de Jonge

   Smart Microscopy: Feature Based Adaptive Sampling for Focused Ion Beam Scanning Electron Microscopy

   In: Microscopy & Microanalysis - The Official M&M 2016 Proceedings. Microscopy & Microanalysis (M&M-2016), July 24-28, Columbus, OH, USA, Page 632, …

6. Patrick Trampert; Sviatoslav Bogachev; Nico Marniok; Tim Dahmen; Philipp Slusallek

   Marker Detection in Electron Tomography: A Comparative Study

   In: Microscopy and Microanalysis, Vol. 21 (Issue 6), Pages 1591-1601, Cambridge Journals, 11/2015.

7. Tim Dahmen; Lukas Marsalek; Nico Marniok; Beata Turonova; Sviatoslav Bogachev; Patrick Trampert; Stefan Nickels; Philipp Slusallek

   Ettention: building blocks for iterative reconstruction algorithms

   In: Proceedings of Microscopy & Microanalysis 2015. Microscopy & Microanalysis (M&M-2015), August 2-6, Portland, OR, USA, Vol. 21, No. S3, MSA, …

8. Tim Dahmen; Lukas Marsalek; Nico Marniok; Beata Turoňová; Sviatoslav Bogachev; Patrick Trampert; Stefan Nickels; Philipp Slusallek

   The Ettention software package

   In: Ultramicroscopy, Vol. n.a. Page n.a. Elsevier, 2015.

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