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Jahr: 2017
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Zeige Ergebnisse 41 bis 50 von 507.

  1. Shoya Ishimaru; Syed Saqib Bukhari; Carina Heisel; Nicolas Großmann; Pascal Klein; Jochen Kuhn; Andreas Dengel

    Augmented Learning on Anticipating Textbooks with Eye Tracking. Positive Learning and Transformation in the Infor- mation Age (PLATO) - A blessing or a curse?

    In: IEEE Transactions on Learning Technologies, Vol. 1, Pages 387-398, Springer, 2017.

  2. Muhammet Bastan; Syed Saqib Bukhari; Thomas Breuel

    Active Canny: Edge Detection and Recovery with Open Active Contour Models

    In: IET Image Processing Journal, Vol. 11, No. 12, Pages 1325-1332, IET, 12/2017.

  3. Peter Lanzer; Mohammad Osamh Adel Al-Naser; Syed Saqib Bukhari; Andreas Dengel; Elizabeth Krupinski

    Eye Tracking in Catheter-Based Cardiovascular Interventions: Early Results

    In: Journal of Medical Imaging, Vol. 4, No. 3, Pages 1-9, SPIE, 2017.

  4. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  5. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November 13-16, Irvine, CA, USA, 2017.

  6. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom, 2017.

  7. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT-2017), October 23-25, Cambridge, United Kingdom, 2017.

  8. Saeideh Shirinzadeh; Mathias Soeken; Pierre-Emmanuel Gaillardon; Giovanni De Micheli; Rolf Drechsler

    Endurance Management for ResistiveLogic-In-Memory Computing Architectures

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.

  9. Muhammad Hassan; Vladimir Herdt; Hoang M. Le; Mingsong Chen; Daniel Große; Rolf Drechsler

    Data Flow Testing for Virtual Prototypes

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.

  10. Patrick Elfert; Marco Eichelberg; Johannes Tröger; Jochen Britz; Jan Alexandersson; Daniel Bieber; Jürgen Bauer; Susanne Teichmann; Ludwig Kuhn; Martin Thielen; Janina Sauer; Alexander Münzberg; Norbert Rösch; Julia Woizischke; Rebeacca Diekmann; Andreas Hein

    DiDiER - digitized services in dietary counselling for people with increased health risks related to malnutrition and food allergies

    In: 2017 IEEE Symposium on Computers and Communications (ISCC). IEEE Symposium on Computers and Communications (ISCC-2017), 22nd, July 3-6, Heraklion, Greece, Pages 100-104, ISBN 978-1-5386-1629-1, IEEE, 9/2017.

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