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Publikationen

Zeige Ergebnisse 21 bis 30 von 505
  1. Fraser Bowen; Jon Dehdari; Josef van Genabith

    The Effect of Error Rate in Artificially Generated Data for Automatic Preposition and Determiner Correction

    In: The Third Workshop on Noisy User-generated Text (W-NUT 2017) - Proceedings of the Workshop. Workshop on Noisy User-generated Text (NUT-2017), …

  2. Nijat Mehdiyev; Johannes Lahann; Andreas Emrich; David Enke; Peter Fettke; Peter Loos

    Time Series Classification using Deep Learning for Process Planning: A Case from the Process Industry

    In: . (Hrsg.). Procedia Computer Science. Complex Adaptive Systems (CAS-2017), USA, Pages 242-249, Vol. 114, 2017.

  3. Jumyung Um; Matthieu Rauch; Jy Hascoet; Ian Stroud

    STEP-NC compliant process planning of additive manufacturing: Remanufacturing

    In: International Journal of Advanced Manufacturing Technology, Vol. 88, Pages 1215-1230, Springer, 2017.

  4. Marie-Helene Stoltz; Vaggelis Giannikas; Duncan Mcfarlane; James Strachan; Jumyung Um; Rengarajan Srinivasan

    Augmented Reality in Warehouse Operations: Oppaortunities and Barriers

    In: IFAC-PapersOnLine, Vol. 50, No. 1, Pages 12979-12984, Elsevier, 2017.

  5. Training CNNs for Image Registration from Few Samples with Model-based Data Augmentation

    In: Maxime Descoteaux; Lena Maier-Hein; Alfred Franz; Pierre Jannin; D. Louis Collins; Simon Duchesne (Hrsg.). Medical Image Computing and Computer …

  6. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  7. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  8. Andreas Schoknecht; Tom Thaler; Peter Fettke; Andreas Oberweis; Ralf Laue

    Similarity of Business Process Models - A State-of-the-Art Analysis

    In: ACM Computing Surveys (CSUR), Vol. 50, No. 4, Pages 52:1-52:33, ACM New York, New York, NY, USA, 8/2017.