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Publikationen

Zeige Ergebnisse 41 bis 50 von 506
  1. DeepBIBX: Deep Learning for Image Based Bibliographic Data Extraction

    In: International Conference on Neural Information Processing. International Conference on Neural Information Processing (ICONIP-2017), 24th …

  2. Gunther Reinhart; Detlef Zühlke

    Von CIM zu Industrie 4.0

    In: Gunther Reinhart. Handbuch Industrie 4.0 - Geschäftsmodelle, Prozesse, Technik. Pages XXXI-XL, ISBN 978-3-446-44642-7, Carl Hanser Verlag GmbH & …

  3. Max Birtel; Fabian Quint; Martin Ruskowski

    Virtuelle Benutzungsschnittstellen auf Basis semantischer Modelle zur vereinfachten Anlageninteraktion

    In: M. Burghardt; R. Wimmer; C. Wolff; C. Womser-Hacker (Hrsg.). Mensch und Computer 2017 - Workshopband. Mensch und Computer (MuC-2017), September …

  4. Mauro Isaja; John Soldatos; Volkan Gezer

    Combining Edge Computing and Blockchains for Flexibility and Performance in Industrial Automation

    In: Eleventh International Conference on Mobile Ubiquitous Computing. International Conference on Mobile Ubiquitous Computing, Systems, Services and …

  5. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  6. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  7. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  8. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  9. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …