Aufgrund von Wartungsarbeiten ist die Suche von Publikationen nach Autor:innen derzeit nicht möglich.
Johannes Bayer (Hrsg.)
IAPR International Workshop on Graphics Recognition (GREC-2017), located at 12th IAPR International Workshop on Graphics Recognition, Japan, 2017.
Faysal Boughorbel; Pavel Potocek; Milos Hovorka; Libor Strakos; John Mitchels; Tomas Vystavel; Patrick Trampert; Ben Lich; Tim Dahmen
In: Microscopy and Microanalysis, Vol. 23, No. S1, Pages 150-151, Cambridge University Press, 7/2017.
Andreas Schoknecht; Tom Thaler; Peter Fettke; Andreas Oberweis; Ralf Laue
In: ACM Computing Surveys (CSUR), Vol. 50, No. 4, Pages 52:1-52:33, ACM New York, New York, NY, USA, 8/2017.
Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill
In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …
Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli
In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.
Arighna Deb; Robert Wille; Rolf Drechsler
In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …
Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler
In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …
Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler
In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …
Jilliam Maria Diaz Barros; Frederic Garcia; Bruno Mirbach; Didier Stricker
In: IEEE International Conference on Image Processing (ICIP). IEEE International Conference on Image Processing (ICIP-2017), September 17-20, Beijing, …
Praveenkumar Jayanna
Mastersthesis, Technische Universität Kaiserslautern, 8/2017.
