Skip to main content Skip to main navigation

Publikationen

Zeige Ergebnisse 11 bis 20 von 505
  1. Fabian Quint; Frieder Loch; Patrick Bertram

    The Challenge of Introducing AR in Industry-Results of a Participative Process Involving Maintenance Engineers

    In: Marcello Pellicciari; Margherita Peruzzini (Hrsg.). Procedia Manufacturing, Vol. 11 - 27th International Conference on Flexible Automation and …

  2. Patrick Bertram; Max Birtel; Fabian Quint; Martin Ruskowski

    Informationsmodellierung zur Beschreibung manueller Tätigkeiten an Handarbeitsplätzen

    In: M. Burghardt; R. Wimmer; C. Wolff; C. Womser-Hacker (Hrsg.). Mensch und Computer 2017 - Workshopband. Mensch und Computer (MuC-2017), September …

  3. Christoph Zetzsche; Ruth Rosenholtz; Noshaba Cheema; Konrad Gadzicki; Lex Fridman; Kerstin Schill

    Neural Computation of Statistical Image Properties in Peripheral Vision

    In: Vision Science Society (Hrsg.). MODVIS. Computational and Mathematical Models in Vision (MODVIS-2017), located at Vision Sciences Society Annual …

  4. Mathias Soeken; Pierre-Emmanuel Gaillardon; Saeideh Shirinzadeh; Rolf Drechsler; Giovanni De Micheli

    A PLiM computer for the IoT

    In: Computers, Vol. 6, Pages 35-40, IEEE, 2017.

  5. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  6. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  7. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …

  8. Saeideh Shirinzadeh; Mathias Soeken; Pierre-Emmanuel Gaillardon; Giovanni De Micheli; Rolf Drechsler

    Endurance Management for ResistiveLogic-In-Memory Computing Architectures

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.

  9. Muhammad Hassan; Vladimir Herdt; Hoang M. Le; Mingsong Chen; Daniel Große; Rolf Drechsler

    Data Flow Testing for Virtual Prototypes

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.