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Publikationen

Zeige Ergebnisse 31 bis 40 von 507
  1. Guilherme Maeda; Gerhard Neumann; Marco Ewerton; Rudolf Lioutikov; Oliver Kroemer; Jan Peters

    Probabilistic movement primitives for coordination of multiple human-robot collaborative tasks

    In: Autonomous Robots, Vol. 41, No. 3, Pages 593-612, Springer, 2017.

  2. Jumyung Um; Matthieu Rauch; Jy Hascoet; Ian Stroud

    STEP-NC compliant process planning of additive manufacturing: Remanufacturing

    In: International Journal of Advanced Manufacturing Technology, Vol. 88, Pages 1215-1230, Springer, 2017.

  3. Marie-Helene Stoltz; Vaggelis Giannikas; Duncan Mcfarlane; James Strachan; Jumyung Um; Rengarajan Srinivasan

    Augmented Reality in Warehouse Operations: Oppaortunities and Barriers

    In: IFAC-PapersOnLine, Vol. 50, No. 1, Pages 12979-12984, Elsevier, 2017.

  4. Training CNNs for Image Registration from Few Samples with Model-based Data Augmentation

    In: Maxime Descoteaux; Lena Maier-Hein; Alfred Franz; Pierre Jannin; D. Louis Collins; Simon Duchesne (Hrsg.). Medical Image Computing and Computer …

  5. DeepBIBX: Deep Learning for Image Based Bibliographic Data Extraction

    In: International Conference on Neural Information Processing. International Conference on Neural Information Processing (ICONIP-2017), 24th …

  6. Hans-Wolfgang Micklitz; Lucia Reisch; Gesche Joost; Helga Zander-Hayat (Hrsg.)

    Verbraucherrecht 2.0 - Verbraucher in der digitalen Welt

    ISBN 9783848741878, Nomos, 2017.

  7. Arighna Deb; Robert Wille; Rolf Drechsler

    Dedicated Synthesis for MZI-based Optical Circuits based on AND-Inverter Graphs

    In: International Conference on Computer Aided Design (ICCAD). IEEE/ACM International Conference on Computer-Aided Design (ICCAD-2017), November …

  8. Frank Sill Torres; Pedro F. R. Leite Junior; Rolf Drechsler

    Unintrusive Aging Analysis based on Offline Learning

    In: 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect and Fault …

  9. Harshad Dhotre; Stephan Eggersglüß; Mehdi Dehbashi; Ulrike Pfannkuchen; Rolf Drechsler

    Machine Learning Based Test Pattern Analysis for Localizing Critical Power Activity Areas

    In: 30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE International Symposium on Defect …

  10. Saeideh Shirinzadeh; Mathias Soeken; Pierre-Emmanuel Gaillardon; Giovanni De Micheli; Rolf Drechsler

    Endurance Management for ResistiveLogic-In-Memory Computing Architectures

    In: Design, Automation and Test in Europe (DATE). Design, Automation & Test in Europe (DATE-2017), March 27-31, Lausanne, Switzerland, 2017.