Mark Niemeyer; Marian Renz; Maren Pukrop; David Hagemann; Tim Zurheide; Daniel Di Marco; Markus Höferlin; Philipp Stark; Florian Rahe; Matthias Igelbrink; Mario Jenz; Thomas Jarmer; Dieter Trautz; Stefan Stiene; Joachim Hertzberg
In: International Conference on Pattern Recognition Applications and Methods. International Conference on Pattern Recognition Applications and Methods …